Radiation-induced leakage currents: Atomic scale mechanisms

P. M. Lenahan; J. P. Campbell; A. Y. Kang; S. T. Liu; R. A. Weimer

doi:10.1109/23.983179

Radiation-induced leakage currents: Atomic scale mechanisms

P. M. Lenahan, J. P. Campbell, A. Y. Kang, S. T. Liu, R. A. Weimer

Research output: Contribution to journal › Conference article › peer-review

21 Scopus citations

Abstract

We link atomic-scale defects called E′ centers to ra- diation-induced leakage current (RILC). We present evidence that strongly suggests that RILC tolerance is processing dependent and that this tolerance appears to be correlated with lower E′ center generation. We furthermore note that in oxides subjected to quite high irradiation levels, the density of (generally electrically neutral) E′ centers is far greater than would be expected for the hole trap E′ centers involved in the radiation-induced positive charge buildup observed in thicker oxides.

Original language	English (US)
Pages (from-to)	2101-2106
Number of pages	6
Journal	IEEE Transactions on Nuclear Science
Volume	48
Issue number	6 I
DOIs	https://doi.org/10.1109/23.983179
State	Published - Dec 2001
Event	2001 Nuclear and Sapce Radiation Effects Conference (NSREC) - Vancouver, BC, Canada Duration: Jul 16 2001 → Jul 20 2001

All Science Journal Classification (ASJC) codes

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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title = "Radiation-induced leakage currents: Atomic scale mechanisms",

abstract = "We link atomic-scale defects called E′ centers to ra- diation-induced leakage current (RILC). We present evidence that strongly suggests that RILC tolerance is processing dependent and that this tolerance appears to be correlated with lower E′ center generation. We furthermore note that in oxides subjected to quite high irradiation levels, the density of (generally electrically neutral) E′ centers is far greater than would be expected for the hole trap E′ centers involved in the radiation-induced positive charge buildup observed in thicker oxides.",

author = "Lenahan, {P. M.} and Campbell, {J. P.} and Kang, {A. Y.} and Liu, {S. T.} and Weimer, {R. A.}",

year = "2001",

month = dec,

doi = "10.1109/23.983179",

language = "English (US)",

volume = "48",

pages = "2101--2106",

journal = "IEEE Transactions on Nuclear Science",

issn = "0018-9499",

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note = "2001 Nuclear and Sapce Radiation Effects Conference (NSREC) ; Conference date: 16-07-2001 Through 20-07-2001",

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T1 - Radiation-induced leakage currents

T2 - 2001 Nuclear and Sapce Radiation Effects Conference (NSREC)

AU - Lenahan, P. M.

AU - Campbell, J. P.

AU - Kang, A. Y.

AU - Liu, S. T.

AU - Weimer, R. A.

PY - 2001/12

Y1 - 2001/12

N2 - We link atomic-scale defects called E′ centers to ra- diation-induced leakage current (RILC). We present evidence that strongly suggests that RILC tolerance is processing dependent and that this tolerance appears to be correlated with lower E′ center generation. We furthermore note that in oxides subjected to quite high irradiation levels, the density of (generally electrically neutral) E′ centers is far greater than would be expected for the hole trap E′ centers involved in the radiation-induced positive charge buildup observed in thicker oxides.

AB - We link atomic-scale defects called E′ centers to ra- diation-induced leakage current (RILC). We present evidence that strongly suggests that RILC tolerance is processing dependent and that this tolerance appears to be correlated with lower E′ center generation. We furthermore note that in oxides subjected to quite high irradiation levels, the density of (generally electrically neutral) E′ centers is far greater than would be expected for the hole trap E′ centers involved in the radiation-induced positive charge buildup observed in thicker oxides.

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DO - 10.1109/23.983179

M3 - Conference article

AN - SCOPUS:0035722925

SN - 0018-9499

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SP - 2101

EP - 2106

JO - IEEE Transactions on Nuclear Science

JF - IEEE Transactions on Nuclear Science

IS - 6 I

Y2 - 16 July 2001 through 20 July 2001

ER -

Radiation-induced leakage currents: Atomic scale mechanisms

Abstract

All Science Journal Classification (ASJC) codes

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