Radiation-induced oxide charge in low- and high-H 2 environments

Nicole L. Rowsey, Mark E. Law, Ronald D. Schrimpf, Daniel M. Fleetwood, Blair R. Tuttle, Sokrates T. Pantelides

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Electronic structure calculations and irradiation measurements are used to obtain insight into oxide trapped charge mechanisms in varying hydrogen ambients. Hole trapping dominates for typical H 2 densities, but protons can dominate at high H 2 densities.

Original languageEnglish (US)
Title of host publicationRADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings
Pages51-53
Number of pages3
DOIs
StatePublished - 2011
Event12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011 - Sevilla, Spain
Duration: Sep 19 2011Sep 23 2011

Publication series

NameProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Other

Other12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011
Country/TerritorySpain
CitySevilla
Period9/19/119/23/11

All Science Journal Classification (ASJC) codes

  • Radiation
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Radiation-induced oxide charge in low- and high-H 2 environments'. Together they form a unique fingerprint.

Cite this