Radiation-induced oxide charge in low-and high-h ₂ environments

Keyphrases

• Radiation Effects 100%
• Interface Traps 100%
• Oxide Trapped Charge 100%
• Oxide Charge 100%
• Proton 66%
• Trapped Charge Density 66%
• First-principles Calculations 33%
• Electronic Structure Calculations 33%
• Oxygen Vacancy 33%
• Hole Trapping 33%
• Charge Transport 33%
• Charge Trapping 33%
• Dangling Bonds 33%
• Relative Concentration 33%
• Molecular Hydrogen 33%
• MOS Structure 33%

Engineering

• Interface Trap 100%
• Charge Density 66%
• Structure Calculation 33%
• Energetics 33%
• Oxygen Vacancy 33%
• Dangling Bond 33%
• Charge Transport 33%
• Molecular Hydrogen 33%

Material Science

• Density 100%
• Oxide Compound 100%
• Electronic Structure Calculation 25%
• Oxygen Vacancy 25%