Refractive index anisotropy in optics using a birefringence mapper

  • Jennifer Sternal
  • , Shai N. Shafrir
  • , Joseph A. Randi
  • , Leslie L. Gregg
  • , Stephen D. Jacobs

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Areal maps of optical retardance are rapidly generated for flat, transmissive optics using a new commercial birefringence mapper. The versatility and capabilities of the mapper are evaluated for a series of parts that include laser glass samples, laser damaged glass, liquid crystal devices, birefringent crystals, and polymers. Potential users may be trained to use the instrument in less than one hour.

    Original languageEnglish (US)
    Title of host publicationOptifab 2003
    Subtitle of host publicationTechnical Digest
    EditorsHarvey M. Pollicove, Walter C. Czajkowski, Toshihide Dohi, Hans Lauth
    PublisherSPIE
    Pages125-127
    Number of pages3
    ISBN (Electronic)9780819451040
    DOIs
    StatePublished - May 19 2003
    EventOptifab 2003: Technical Digest - Rochester, United States
    Duration: May 19 2003May 22 2003

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume10314
    ISSN (Print)0277-786X
    ISSN (Electronic)1996-756X

    Other

    OtherOptifab 2003: Technical Digest
    Country/TerritoryUnited States
    CityRochester
    Period5/19/035/22/03

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

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