TY - JOUR
T1 - Rejuvenation of degraded Zener diodes with the electron wind force
AU - Rahman, Md Hafijur
AU - Al-Mamun, Nahid Sultan
AU - Glavin, Nicholas
AU - Haque, Aman
AU - Ren, Fan
AU - Pearton, Stephen
AU - Wolfe, Douglas E.
N1 - Publisher Copyright:
© 2024 The Author(s). Published on behalf of The Japan Society of Applied Physics by IOP Publishing Ltd
PY - 2024/4/1
Y1 - 2024/4/1
N2 - In this study, we explore the rejuvenation of a Zener diode degraded by high electrical stress, leading to a leftward shift, and broadening of the Zener breakdown voltage knee, alongside a 57% reduction in forward current. We employed a non-thermal annealing method involving high-density electric pulses with short pulse width and low frequency. The annealing process took <30 s at near-ambient temperature. Raman spectroscopy supports the electrical characterization, showing enhancement in crystallinity to explain the restoration of the breakdown knee followed by improvement in forward current by ∼85%.
AB - In this study, we explore the rejuvenation of a Zener diode degraded by high electrical stress, leading to a leftward shift, and broadening of the Zener breakdown voltage knee, alongside a 57% reduction in forward current. We employed a non-thermal annealing method involving high-density electric pulses with short pulse width and low frequency. The annealing process took <30 s at near-ambient temperature. Raman spectroscopy supports the electrical characterization, showing enhancement in crystallinity to explain the restoration of the breakdown knee followed by improvement in forward current by ∼85%.
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U2 - 10.35848/1882-0786/ad379c
DO - 10.35848/1882-0786/ad379c
M3 - Article
AN - SCOPUS:85190725215
SN - 1882-0778
VL - 17
JO - Applied Physics Express
JF - Applied Physics Express
IS - 4
M1 - 047001
ER -