Relationship between critical current density and self-field losses of Ag-sheathed (Bi,Pb)2Sr2Ca2Cu3O x superconducting tapes

Doan N. Nguyen; Pamidi V.P.S.S. Sastry; Guomin Zhang; David C. Knoll; Justin Schwartz

doi:10.1063/1.2192412

Relationship between critical current density and self-field losses of Ag-sheathed (Bi,Pb)₂Sr₂Ca₂Cu₃O _x superconducting tapes

Doan N. Nguyen, Pamidi V.P.S.S. Sastry, Guomin Zhang, David C. Knoll, Justin Schwartz

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The critical current of (Bi,Pb)₂Sr₂Ca ₂Cu₃O_x (Bi-2223) was varied between 2 A and 120 A using three different approaches: field angle with respect to the wide face of the tape, mechanical strain, and heat treatments. The results of transport loss measurements carried out on the three sets of samples showed that reduced critical current density caused an increase in AC loss as expected from Norris's model. Comparison of the data among the three sets, however, showed some interesting features in the dependence of the AC loss behavior on the method used to vary critical current density. The results are explained based on the type of defects, localized or distributed, caused by the particular approach used in lowering the critical current.

Original language	English (US)
Title of host publication	ADVANCES IN CRYOGENIC ENGINEERING
Subtitle of host publication	Transactions of the International Cryogenic Materials Conference, ICMC, Volume 52B
Pages	696-703
Number of pages	8
DOIs	https://doi.org/10.1063/1.2192412
State	Published - Mar 31 2006
Event	ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC - Keystone, CO, United States Duration: Aug 29 2005 → Sep 2 2005

Publication series

Name	AIP Conference Proceedings
Volume	824 II
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Other

Other	ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC
Country/Territory	United States
City	Keystone, CO
Period	8/29/05 → 9/2/05

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

Access to Document

10.1063/1.2192412

Cite this

Nguyen, D. N., Sastry, P. V. P. S. S., Zhang, G., Knoll, D. C., & Schwartz, J. (2006). Relationship between critical current density and self-field losses of Ag-sheathed (Bi,Pb)₂Sr₂Ca₂Cu₃O _x superconducting tapes. In ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC, Volume 52B (pp. 696-703). (AIP Conference Proceedings; Vol. 824 II). https://doi.org/10.1063/1.2192412

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abstract = "The critical current of (Bi,Pb)2Sr2Ca 2Cu3Ox (Bi-2223) was varied between 2 A and 120 A using three different approaches: field angle with respect to the wide face of the tape, mechanical strain, and heat treatments. The results of transport loss measurements carried out on the three sets of samples showed that reduced critical current density caused an increase in AC loss as expected from Norris's model. Comparison of the data among the three sets, however, showed some interesting features in the dependence of the AC loss behavior on the method used to vary critical current density. The results are explained based on the type of defects, localized or distributed, caused by the particular approach used in lowering the critical current.",

author = "Nguyen, {Doan N.} and Sastry, {Pamidi V.P.S.S.} and Guomin Zhang and Knoll, {David C.} and Justin Schwartz",

note = "Copyright: Copyright 2008 Elsevier B.V., All rights reserved.; ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC ; Conference date: 29-08-2005 Through 02-09-2005",

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Nguyen, DN, Sastry, PVPSS, Zhang, G, Knoll, DC & Schwartz, J 2006, Relationship between critical current density and self-field losses of Ag-sheathed (Bi,Pb)₂Sr₂Ca₂Cu₃O _x superconducting tapes. in ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC, Volume 52B. AIP Conference Proceedings, vol. 824 II, pp. 696-703, ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC, Keystone, CO, United States, 8/29/05. https://doi.org/10.1063/1.2192412

Relationship between critical current density and self-field losses of Ag-sheathed (Bi,Pb)₂Sr₂Ca₂Cu₃O _x superconducting tapes. / Nguyen, Doan N.; Sastry, Pamidi V.P.S.S.; Zhang, Guomin et al.
ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC, Volume 52B. 2006. p. 696-703 (AIP Conference Proceedings; Vol. 824 II).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Nguyen DN, Sastry PVPSS, Zhang G, Knoll DC, Schwartz J. Relationship between critical current density and self-field losses of Ag-sheathed (Bi,Pb)₂Sr₂Ca₂Cu₃O _x superconducting tapes. In ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC, Volume 52B. 2006. p. 696-703. (AIP Conference Proceedings). doi: 10.1063/1.2192412