Relationship between the 4H-SiC/SiO2 interface structure and electronic properties explored by electrically detected magnetic resonance

Mark A. Anders, Patrick M. Lenahan, Corey J. Cochrane, Aivars J. Lelis

Research output: Contribution to journalArticlepeer-review

26 Scopus citations

Fingerprint

Dive into the research topics of 'Relationship between the 4H-SiC/SiO2 interface structure and electronic properties explored by electrically detected magnetic resonance'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds