Relaxor based fine grain piezoelectric materials

N. Kim; S. J. Jang; T. R. Shrout

Relaxor based fine grain piezoelectric materials

N. Kim, S. J. Jang, T. R. Shrout

Materials Research Institute (MRI)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Scopus citations

Abstract

The dielectric and piezoelectric properties of polycrystalline ceramics of relaxor ferroelectric lead magnesium niobate-lead titanate modified with La₂O₃, (1-x) (Pb_0.985La_0.01)□_0.005 (Mb_1/3N_2/3)-(x)PbTiO₃, were investigated. The compositional range of 0.2 ≤ x ≤ 0.4, being near the morphotropic phase boundary, was characterized. Lanthanum doping resulted in reduction of grain size, enhanced density, a downward shift of and the dielectric maximum temperature. The final microstructures of all compositions were fine with uniform grain size distributions. Room-temperature dielectric constants Ks of 5000 and piezoelectric constants d_33(s) of 500 pC/N were found for compositions near the morphotropic phase boundary (x ≈ 0.33).

Original language	English (US)
Title of host publication	90 IEEE 7 Int Symp Appl Ferroelectr
Publisher	Publ by IEEE
Pages	605-609
Number of pages	5
ISBN (Print)	0780301900
State	Published - 1992
Event	1990 IEEE 7th International Symposium on Applications of Ferroelectrics - Champaign, IL, USA Duration: Jun 6 1990 → Jun 8 1990

Publication series

Name	90 IEEE 7 Int Symp Appl Ferroelectr

Other

Other	1990 IEEE 7th International Symposium on Applications of Ferroelectrics
City	Champaign, IL, USA
Period	6/6/90 → 6/8/90

All Science Journal Classification (ASJC) codes

General Engineering

Cite this

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title = "Relaxor based fine grain piezoelectric materials",

abstract = "The dielectric and piezoelectric properties of polycrystalline ceramics of relaxor ferroelectric lead magnesium niobate-lead titanate modified with La2O3, (1-x) (Pb0.985La0.01)□0.005 (Mb1/3N2/3)-(x)PbTiO3, were investigated. The compositional range of 0.2 ≤ x ≤ 0.4, being near the morphotropic phase boundary, was characterized. Lanthanum doping resulted in reduction of grain size, enhanced density, a downward shift of and the dielectric maximum temperature. The final microstructures of all compositions were fine with uniform grain size distributions. Room-temperature dielectric constants Ks of 5000 and piezoelectric constants d33(s) of 500 pC/N were found for compositions near the morphotropic phase boundary (x ≈ 0.33).",

author = "N. Kim and Jang, {S. J.} and Shrout, {T. R.}",

year = "1992",

language = "English (US)",

isbn = "0780301900",

series = "90 IEEE 7 Int Symp Appl Ferroelectr",

publisher = "Publ by IEEE",

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note = "1990 IEEE 7th International Symposium on Applications of Ferroelectrics ; Conference date: 06-06-1990 Through 08-06-1990",

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T1 - Relaxor based fine grain piezoelectric materials

AU - Kim, N.

AU - Jang, S. J.

AU - Shrout, T. R.

PY - 1992

Y1 - 1992

N2 - The dielectric and piezoelectric properties of polycrystalline ceramics of relaxor ferroelectric lead magnesium niobate-lead titanate modified with La2O3, (1-x) (Pb0.985La0.01)□0.005 (Mb1/3N2/3)-(x)PbTiO3, were investigated. The compositional range of 0.2 ≤ x ≤ 0.4, being near the morphotropic phase boundary, was characterized. Lanthanum doping resulted in reduction of grain size, enhanced density, a downward shift of and the dielectric maximum temperature. The final microstructures of all compositions were fine with uniform grain size distributions. Room-temperature dielectric constants Ks of 5000 and piezoelectric constants d33(s) of 500 pC/N were found for compositions near the morphotropic phase boundary (x ≈ 0.33).

AB - The dielectric and piezoelectric properties of polycrystalline ceramics of relaxor ferroelectric lead magnesium niobate-lead titanate modified with La2O3, (1-x) (Pb0.985La0.01)□0.005 (Mb1/3N2/3)-(x)PbTiO3, were investigated. The compositional range of 0.2 ≤ x ≤ 0.4, being near the morphotropic phase boundary, was characterized. Lanthanum doping resulted in reduction of grain size, enhanced density, a downward shift of and the dielectric maximum temperature. The final microstructures of all compositions were fine with uniform grain size distributions. Room-temperature dielectric constants Ks of 5000 and piezoelectric constants d33(s) of 500 pC/N were found for compositions near the morphotropic phase boundary (x ≈ 0.33).

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M3 - Conference contribution

AN - SCOPUS:0026995104

SN - 0780301900

T3 - 90 IEEE 7 Int Symp Appl Ferroelectr

SP - 605

EP - 609

BT - 90 IEEE 7 Int Symp Appl Ferroelectr

PB - Publ by IEEE

T2 - 1990 IEEE 7th International Symposium on Applications of Ferroelectrics

Y2 - 6 June 1990 through 8 June 1990

ER -

Relaxor based fine grain piezoelectric materials

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