TY - GEN
T1 - Relaxor-PT single crystals for various applications
AU - Zhang, Shujun
AU - Li, Fei
AU - Shrout, Thomas R.
AU - Luo, Jun
PY - 2012/10/31
Y1 - 2012/10/31
N2 - Piezoelectric materials lie at the heart of electromechanical transducers. Applications include actuators, ultrasonic imaging and high intensity focused ultrasound (HIFU), underwater sonar, non-destructive evaluation (NDE), resonators, pressure sensors and accelerometers to name a few. In this work, we report on recent developments of the shear properties of Relaxor-PT single crystals with different phases and orientations, as a function of temperature and applied fields. Specifically, the piezoelectric shear d 24 coefficient in orthorhombic crystals was found to exhibit nearly temperature independent behavior, while acceptor doped relaxor-PT crystals exhibited improved field stability, due to the enhanced coercive fields and/or internal bias. Furthermore, the newly reported face shear vibration mode was studied, showing high ac drive field stability up to their respective coercive field, with high mechanical quality factors, being on the order of 100-300.
AB - Piezoelectric materials lie at the heart of electromechanical transducers. Applications include actuators, ultrasonic imaging and high intensity focused ultrasound (HIFU), underwater sonar, non-destructive evaluation (NDE), resonators, pressure sensors and accelerometers to name a few. In this work, we report on recent developments of the shear properties of Relaxor-PT single crystals with different phases and orientations, as a function of temperature and applied fields. Specifically, the piezoelectric shear d 24 coefficient in orthorhombic crystals was found to exhibit nearly temperature independent behavior, while acceptor doped relaxor-PT crystals exhibited improved field stability, due to the enhanced coercive fields and/or internal bias. Furthermore, the newly reported face shear vibration mode was studied, showing high ac drive field stability up to their respective coercive field, with high mechanical quality factors, being on the order of 100-300.
UR - http://www.scopus.com/inward/record.url?scp=84867905139&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84867905139&partnerID=8YFLogxK
U2 - 10.1109/ISAF.2012.6297735
DO - 10.1109/ISAF.2012.6297735
M3 - Conference contribution
AN - SCOPUS:84867905139
SN - 9781467326681
T3 - Proceedings of 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics held jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE PFM, ISAF/ECAPD/PFM 2012
BT - Proc. of 2012 21st IEEE International Symposium on Applications of Ferroelectrics Held Jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE, ISAF/ECAPD/PFM 2012
T2 - 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics Held with 11th IEEE European Conf. on Applications of Polar Dielectrics and 4th IEEE Int. Symp on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, ISAF/ECAPD/PFM
Y2 - 9 July 2012 through 13 July 2012
ER -