Reliability-centric high-level synthesis

S. Tosun, N. Mansouri, E. Arvas, M. Kandemir, Yuan Xie

Research output: Chapter in Book/Report/Conference proceedingConference contribution

62 Scopus citations

Abstract

Importance of addressing soft errors in both safety critical applications and commercial consumer products is increasing, mainly due to ever shrinking geometries, higher-density circuits, and employment of power-saving techniques such as voltage scaling and component shut-down. As a result, it is becoming necessary to treat reliability as a first-class citizen in system design. In particular, reliability decisions taken early in system design can have significant benefits in terms of design quality. Motivated by this observation, this paper presents a reliability-centric high-level synthesis approach that addresses the soft error problem. The proposed approach tries to maximize reliability of the design while observing the bounds on area and performance, and makes use of our reliability characterization of hardware components such as adders and multipliers. We implemented the proposed approach, performed experiments with several designs, and compared the results with those obtained by a prior proposal.

Original languageEnglish (US)
Title of host publicationProceedings - Design, Automation and Test in Europe, DATE '05
Pages1258-1263
Number of pages6
DOIs
StatePublished - 2005
EventDesign, Automation and Test in Europe, DATE '05 - Munich, Germany
Duration: Mar 7 2005Mar 11 2005

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE '05
VolumeII
ISSN (Print)1530-1591

Other

OtherDesign, Automation and Test in Europe, DATE '05
Country/TerritoryGermany
CityMunich
Period3/7/053/11/05

All Science Journal Classification (ASJC) codes

  • General Engineering

Fingerprint

Dive into the research topics of 'Reliability-centric high-level synthesis'. Together they form a unique fingerprint.

Cite this