Skip to main navigation Skip to search Skip to main content

Reliability concerns for HfO2/Si devices: Interface and dielectric traps

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2   Link opens in a new tab Scopus citations

Fingerprint

Dive into the research topics of 'Reliability concerns for HfO2/Si devices: Interface and dielectric traps'. Together they form a unique fingerprint.
Sort by

Keyphrases

Physics

Material Science

Engineering