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Reliability of III-V devices - The defects that cause the trouble
Sokrates T. Pantelides, Yevgeniy Puzyrev, Xiao Shen, Tania Roy, Sandeepan Dasgupta, Blair R. Tuttle, Daniel M. Fleetwood, Ronald D. Schrimpf
Research output: Contribution to journal › Article › peer-review
33
Scopus
citations