TY - JOUR
T1 - Reliability test of popular fractal techniques applied to small two-dimensional self-affine data sets
AU - Talibuddin, S.
AU - Runt, J. P.
PY - 1994
Y1 - 1994
N2 - The fractal dimensions of five fractional Brownian motion (fBm) surfaces of 257×257 pixel size, with Hurst exponent H ranging from 0.1 to 0.9, were computed by profile, contour, and surface area analyses. A technique was deemed reliable if it demonstrated accuracy, consistency and sensitivity. Of all the techniques examined, surface area analysis methods, namely, two-dimensional pyramid and Peleg methods, were found to be most reliable and efficient for the data size studied. Hence, these were employed in a preliminary fractal analysis of poly(methyl methacrylate) and poly(styrene) fracture surfaces. The surfaces were imaged at scan sizes ranging from 1-6.5 μm by atomic force microscopy (AFM). The images indicated the existence of fractal structure and a high degree of roughness at microstructural scales for both the surfaces. These observations were supported by the results of the two surface area analysis techniques. A more conclusive study was prevented by severe scoring of the surfaces by the AFM tip at smaller scan sizes and the availability of only a narrow range of scan sizes.
AB - The fractal dimensions of five fractional Brownian motion (fBm) surfaces of 257×257 pixel size, with Hurst exponent H ranging from 0.1 to 0.9, were computed by profile, contour, and surface area analyses. A technique was deemed reliable if it demonstrated accuracy, consistency and sensitivity. Of all the techniques examined, surface area analysis methods, namely, two-dimensional pyramid and Peleg methods, were found to be most reliable and efficient for the data size studied. Hence, these were employed in a preliminary fractal analysis of poly(methyl methacrylate) and poly(styrene) fracture surfaces. The surfaces were imaged at scan sizes ranging from 1-6.5 μm by atomic force microscopy (AFM). The images indicated the existence of fractal structure and a high degree of roughness at microstructural scales for both the surfaces. These observations were supported by the results of the two surface area analysis techniques. A more conclusive study was prevented by severe scoring of the surfaces by the AFM tip at smaller scan sizes and the availability of only a narrow range of scan sizes.
UR - http://www.scopus.com/inward/record.url?scp=0001366050&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0001366050&partnerID=8YFLogxK
U2 - 10.1063/1.358490
DO - 10.1063/1.358490
M3 - Article
AN - SCOPUS:0001366050
SN - 0021-8979
VL - 76
SP - 5070
EP - 5078
JO - Journal of Applied Physics
JF - Journal of Applied Physics
IS - 9
ER -