TY - JOUR
T1 - Representative volume elements of strain/stress fields measured by diffraction techniques
AU - Şeren, Mehmet Hazar
AU - Pagan, Darren C.
AU - Noyan, Ismail Cevdet
AU - Keckes, J.
N1 - Publisher Copyright:
© 2023 International Union of Crystallography. All rights reserved.
PY - 2023/7/20
Y1 - 2023/7/20
N2 - Finite-element modelling has been used to simulate local strains and stresses within free-standing polycrystalline slabs of W, Cu and W-Cu, heated with free or constrained boundaries. The elastic strain values in crystallites that satisfied the diffraction condition were used to simulate the lattice strain data that would be obtained from diffraction analysis, from which the average stresses within diffracting domains were computed. Comparison of direct-space stresses in the model with the average stresses determined from diffraction analysis shows that the representative volume elements (RVEs) required to obtain equivalent stress/strain values depend on the deformation mode suffered by the material. Further, the direct-space and diffraction stress values agree only under strict sampling and strain/stress uniformity conditions. Consequently, in samples where measurements are conducted in volumes smaller than the RVE, or where the uniformity conditions are not satisfied, further experimental and numerical techniques might be needed for the accurate determination of applied or residual stress distributions.
AB - Finite-element modelling has been used to simulate local strains and stresses within free-standing polycrystalline slabs of W, Cu and W-Cu, heated with free or constrained boundaries. The elastic strain values in crystallites that satisfied the diffraction condition were used to simulate the lattice strain data that would be obtained from diffraction analysis, from which the average stresses within diffracting domains were computed. Comparison of direct-space stresses in the model with the average stresses determined from diffraction analysis shows that the representative volume elements (RVEs) required to obtain equivalent stress/strain values depend on the deformation mode suffered by the material. Further, the direct-space and diffraction stress values agree only under strict sampling and strain/stress uniformity conditions. Consequently, in samples where measurements are conducted in volumes smaller than the RVE, or where the uniformity conditions are not satisfied, further experimental and numerical techniques might be needed for the accurate determination of applied or residual stress distributions.
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U2 - 10.1107/S1600576723004351
DO - 10.1107/S1600576723004351
M3 - Article
C2 - 37555214
AN - SCOPUS:85168091731
SN - 0021-8898
VL - 56
SP - 1144
EP - 1167
JO - Journal of Applied Crystallography
JF - Journal of Applied Crystallography
ER -