Retardance of chalcogenide thin films grown by the oblique-angle-deposition technique

Raúl J. Martín-Palma; Fan Zhang; Akhlesh Lakhtakia; An Cheng; Jian Xu; Carlo G. Pantano

doi:10.1016/j.tsf.2009.03.200

Retardance of chalcogenide thin films grown by the oblique-angle-deposition technique

Raúl J. Martín-Palma, Fan Zhang, Akhlesh Lakhtakia, An Cheng, Jian Xu, Carlo G. Pantano

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

Columnar and chevronic thin films of GeSbSe chalcogenide glasses were grown by the oblique-angle-deposition technique. These thin films were found to exhibit dielectric anisotropy in the near-infrared regime. The retardance of any of the fabricated thin films was found to increase linearly with the thickness. Columnar thin films exhibited significantly lower retardance per unit thickness than chevronic thin films. The experimental results indicate the potential of these thin films for near-infrared polarizers.

Original language	English (US)
Pages (from-to)	5553-5556
Number of pages	4
Journal	Thin Solid Films
Volume	517
Issue number	18
DOIs	https://doi.org/10.1016/j.tsf.2009.03.200
State	Published - Jul 31 2009

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1016/j.tsf.2009.03.200

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title = "Retardance of chalcogenide thin films grown by the oblique-angle-deposition technique",

abstract = "Columnar and chevronic thin films of GeSbSe chalcogenide glasses were grown by the oblique-angle-deposition technique. These thin films were found to exhibit dielectric anisotropy in the near-infrared regime. The retardance of any of the fabricated thin films was found to increase linearly with the thickness. Columnar thin films exhibited significantly lower retardance per unit thickness than chevronic thin films. The experimental results indicate the potential of these thin films for near-infrared polarizers.",

author = "Mart{\'i}n-Palma, {Ra{\'u}l J.} and Fan Zhang and Akhlesh Lakhtakia and An Cheng and Jian Xu and Pantano, {Carlo G.}",

note = "Funding Information: The authors acknowledge the use of facilities at the PSU site of NSF NNIN, and the financial support of the NSF IMI on New Functionality in Glasses (DMR-0409588). R.J. Mart{\'i}n-Palma acknowledges the financial support from the Ministerio de Educaci{\'o}n y Ciencia (Spain) through grant number PR2007-0085. A. Lakhtakia thanks the Charles Godfrey Binder Endowment at Penn State. Copyright: Copyright 2009 Elsevier B.V., All rights reserved.",

year = "2009",

month = jul,

day = "31",

doi = "10.1016/j.tsf.2009.03.200",

language = "English (US)",

volume = "517",

pages = "5553--5556",

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T1 - Retardance of chalcogenide thin films grown by the oblique-angle-deposition technique

AU - Martín-Palma, Raúl J.

AU - Zhang, Fan

AU - Lakhtakia, Akhlesh

AU - Cheng, An

AU - Xu, Jian

AU - Pantano, Carlo G.

N1 - Funding Information: The authors acknowledge the use of facilities at the PSU site of NSF NNIN, and the financial support of the NSF IMI on New Functionality in Glasses (DMR-0409588). R.J. Martín-Palma acknowledges the financial support from the Ministerio de Educación y Ciencia (Spain) through grant number PR2007-0085. A. Lakhtakia thanks the Charles Godfrey Binder Endowment at Penn State. Copyright: Copyright 2009 Elsevier B.V., All rights reserved.

PY - 2009/7/31

Y1 - 2009/7/31

N2 - Columnar and chevronic thin films of GeSbSe chalcogenide glasses were grown by the oblique-angle-deposition technique. These thin films were found to exhibit dielectric anisotropy in the near-infrared regime. The retardance of any of the fabricated thin films was found to increase linearly with the thickness. Columnar thin films exhibited significantly lower retardance per unit thickness than chevronic thin films. The experimental results indicate the potential of these thin films for near-infrared polarizers.

AB - Columnar and chevronic thin films of GeSbSe chalcogenide glasses were grown by the oblique-angle-deposition technique. These thin films were found to exhibit dielectric anisotropy in the near-infrared regime. The retardance of any of the fabricated thin films was found to increase linearly with the thickness. Columnar thin films exhibited significantly lower retardance per unit thickness than chevronic thin films. The experimental results indicate the potential of these thin films for near-infrared polarizers.

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JO - Thin Solid Films

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IS - 18

ER -

Retardance of chalcogenide thin films grown by the oblique-angle-deposition technique

Abstract

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