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Retention Analysis of Ferroelectric FETs with Gate-Side Injection for Vertical NAND Storage

  • Yixin Qin
  • , Saikat Chakraborty
  • , Zijian Zhao
  • , Sizhe Ma
  • , Moonyoung Jung
  • , Kijoon Kim
  • , Suhwan Lim
  • , Kwangyou Seo
  • , Kwangsoo Kim
  • , Wanki Kim
  • , Daewon Ha
  • , Vijaykrishnan Narayanan
  • , Jaydeep P. Kulkarni
  • , Kai Ni

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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