RFId application challenges and risk analysis

Xiao Dan Wu; Yun Feng Wang; Jun Bo Bai; Hai Yan Wang; Chao Hsien Chu

doi:10.1109/ICIEEM.2010.5646426

RFId application challenges and risk analysis

Xiao Dan Wu, Yun Feng Wang, Jun Bo Bai, Hai Yan Wang, Chao Hsien Chu

College of Information Sciences and Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

10 Scopus citations

Abstract

RFID application becomes the focus recently. As an automatic identification technology, RFID has many advantages over traditional one like barcode. It does bring about tremendous changes, and also face lots of barriers during investment. In this paper, we integrate technology risk, IT risk and RFID risk, develop a RFID risk factor framework with analogy method, and find out the relationship between RFID uncertainty and RFID risk. Subjective Scoring Method is adopted to assess RFID risk level. Finally, RFID risk management methods for different kinds of risks are provided.

Original language	English (US)
Title of host publication	Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010
Pages	1086-1090
Number of pages	5
DOIs	https://doi.org/10.1109/ICIEEM.2010.5646426
State	Published - 2010
Event	17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010 - Xiamen, China Duration: Oct 29 2010 → Oct 31 2010

Publication series

Name	Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010

Other

Other	17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010
Country/Territory	China
City	Xiamen
Period	10/29/10 → 10/31/10

All Science Journal Classification (ASJC) codes

Industrial and Manufacturing Engineering

Access to Document

10.1109/ICIEEM.2010.5646426

Cite this

Wu, X. D., Wang, Y. F., Bai, J. B., Wang, H. Y., & Chu, C. H. (2010). RFId application challenges and risk analysis. In Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010 (pp. 1086-1090). Article 5646426 (Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010). https://doi.org/10.1109/ICIEEM.2010.5646426

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title = "RFId application challenges and risk analysis",

abstract = "RFID application becomes the focus recently. As an automatic identification technology, RFID has many advantages over traditional one like barcode. It does bring about tremendous changes, and also face lots of barriers during investment. In this paper, we integrate technology risk, IT risk and RFID risk, develop a RFID risk factor framework with analogy method, and find out the relationship between RFID uncertainty and RFID risk. Subjective Scoring Method is adopted to assess RFID risk level. Finally, RFID risk management methods for different kinds of risks are provided.",

author = "Wu, {Xiao Dan} and Wang, {Yun Feng} and Bai, {Jun Bo} and Wang, {Hai Yan} and Chu, {Chao Hsien}",

year = "2010",

doi = "10.1109/ICIEEM.2010.5646426",

language = "English (US)",

isbn = "9781424464814",

series = "Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010",

pages = "1086--1090",

booktitle = "Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010",

note = "17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010 ; Conference date: 29-10-2010 Through 31-10-2010",

}

Wu, XD, Wang, YF, Bai, JB, Wang, HY & Chu, CH 2010, RFId application challenges and risk analysis. in Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010., 5646426, Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010, pp. 1086-1090, 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010, Xiamen, China, 10/29/10. https://doi.org/10.1109/ICIEEM.2010.5646426

RFId application challenges and risk analysis. / Wu, Xiao Dan; Wang, Yun Feng; Bai, Jun Bo et al.
Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010. 2010. p. 1086-1090 5646426 (Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - RFId application challenges and risk analysis

AU - Wu, Xiao Dan

AU - Wang, Yun Feng

AU - Bai, Jun Bo

AU - Wang, Hai Yan

AU - Chu, Chao Hsien

PY - 2010

Y1 - 2010

N2 - RFID application becomes the focus recently. As an automatic identification technology, RFID has many advantages over traditional one like barcode. It does bring about tremendous changes, and also face lots of barriers during investment. In this paper, we integrate technology risk, IT risk and RFID risk, develop a RFID risk factor framework with analogy method, and find out the relationship between RFID uncertainty and RFID risk. Subjective Scoring Method is adopted to assess RFID risk level. Finally, RFID risk management methods for different kinds of risks are provided.

AB - RFID application becomes the focus recently. As an automatic identification technology, RFID has many advantages over traditional one like barcode. It does bring about tremendous changes, and also face lots of barriers during investment. In this paper, we integrate technology risk, IT risk and RFID risk, develop a RFID risk factor framework with analogy method, and find out the relationship between RFID uncertainty and RFID risk. Subjective Scoring Method is adopted to assess RFID risk level. Finally, RFID risk management methods for different kinds of risks are provided.

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DO - 10.1109/ICIEEM.2010.5646426

M3 - Conference contribution

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SN - 9781424464814

T3 - Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010

SP - 1086

EP - 1090

BT - Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010

T2 - 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010

Y2 - 29 October 2010 through 31 October 2010

ER -

Wu XD, Wang YF, Bai JB, Wang HY, Chu CH. RFId application challenges and risk analysis. In Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010. 2010. p. 1086-1090. 5646426. (Proceedings - 2010 IEEE 17th International Conference on Industrial Engineering and Engineering Management, IE and EM2010). doi: 10.1109/ICIEEM.2010.5646426

RFId application challenges and risk analysis

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