Robust extraction of the frequency-dependent characteristic impedance of transmission lines using one-port TDR measurements

Woopoung Kim, Seock Hee Lee, Madhavan Swaminathan, Rao R. Tummala

Research output: Contribution to conferencePaperpeer-review

6 Scopus citations

Abstract

This paper discusses a method for extracting the frequency dependent characteristic impedance of transmission lines from Time Domain Reflectometry (TDR) measurements using an Open, Short, Load, and Shortlin calibration. The frequency dependent behavior of transmission lines was successfully captured using this method. Two types of transmission lines were measured using this method namely, thick metal transmission lines in Printed Wiring Board (PWB) and thin transmission lines in MCM-L technology.

Original languageEnglish (US)
Pages113-116
Number of pages4
StatePublished - 2001
EventIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging - Cambridge, MA, United States
Duration: Oct 29 2001Oct 31 2001

Conference

ConferenceIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging
Country/TerritoryUnited States
CityCambridge, MA
Period10/29/0110/31/01

All Science Journal Classification (ASJC) codes

  • General Engineering

Fingerprint

Dive into the research topics of 'Robust extraction of the frequency-dependent characteristic impedance of transmission lines using one-port TDR measurements'. Together they form a unique fingerprint.

Cite this