Robust mechanical property measurements of fibrous parylene-C thin-film substrate via moiré contouring technology

  • F. M. Sciammarella
  • , C. A. Sciammarella
  • , L. Lamberti
  • , M. Styrcula
  • , L. Wei
  • , A. Lakhtakia

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

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Keyphrases

Engineering

Material Science