Abstract
The structural degradation of polytetrafluoroethylene (PTFE) upon irradiation with MeV alpha (α) particles is accompanied by the proliferation of hydrogenated and oxygen-functionalized fluorocarbon species. In this article, we explore the origin of monoxide- and dioxide-functionalized fluorocarbon species that emerge upon α particle irradiation of PTFE. Samples of neat PTFE were irradiated to α doses in the range of 107 -5× 1010 rad using 5.5 MeV He 2+ 4 ions produced in a tandem accelerator. Static time-of-flight secondary-ion-mass spectrometry (TOF-SIMS), using a 20 keV C60+ source, was employed to probe chemical changes as a function of α particle irradiation. Chemical images and high-resolution mass spectra were collected in both the positive and negative polarities. Residual gas analysis, utilized to monitor the liberation of molecular gases during α particle irradiation of the PTFE in vacuum, is discussed in relationship to the TOF-SIMS data.
Original language | English (US) |
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Article number | 017604JVA |
Pages (from-to) | 1166-1171 |
Number of pages | 6 |
Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
Volume | 24 |
Issue number | 4 |
DOIs | |
State | Published - Jul 2006 |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films