Abstract
The structural degradation of polytetrafluoroethylene (PTFE) upon irradiation with MeV alpha (α) particles is accompanied by the proliferation of hydrogenated and oxygen-functionalized fluorocarbon species. In this article, we explore the origin of monoxide- and dioxide-functionalized fluorocarbon species that emerge upon α particle irradiation of PTFE. Samples of neat PTFE were irradiated to α doses in the range of 107 -5× 1010 rad using 5.5 MeV He 2+ 4 ions produced in a tandem accelerator. Static time-of-flight secondary-ion-mass spectrometry (TOF-SIMS), using a 20 keV C60+ source, was employed to probe chemical changes as a function of α particle irradiation. Chemical images and high-resolution mass spectra were collected in both the positive and negative polarities. Residual gas analysis, utilized to monitor the liberation of molecular gases during α particle irradiation of the PTFE in vacuum, is discussed in relationship to the TOF-SIMS data.
| Original language | English (US) |
|---|---|
| Article number | 017604JVA |
| Pages (from-to) | 1166-1171 |
| Number of pages | 6 |
| Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
| Volume | 24 |
| Issue number | 4 |
| DOIs | |
| State | Published - Jul 2006 |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films