Scalable driver I/O macromodels for statistical analysis

Bhyrav Mutnury; Madhavan Swaminathan; Moises Cases; Nam Pham; Daniel N. De Araujo; Erdem Matoglu

doi:10.1109/EPEP.2005.1563747

Scalable driver I/O macromodels for statistical analysis

Bhyrav Mutnury, Madhavan Swaminathan, Moises Cases, Nam Pham, Daniel N. De Araujo, Erdem Matoglu

Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

In this paper, scalable driver I/O macromodels have been proposed for efficient signal integrity and timing analysis of today's high-speed systems. Variations in semiconductor process, temperature, and power supply voltage affect the output voltage and current in driver circuits. The effect of these variations on driver and receiver circuits has been captured using Lagrange's interpolation technique. In this paper, scalable macromodeling approach has been applied to differential driver circuits and single-ended driver and receiver circuits. Scalable driver and receiver circuits consume less CPU memory and simulation time compared to transistor-level driver and receiver circuits. The accuracy of scalable macromodels has been tested on various test cases for differential driver and single-ended driver-receiver circuits and results yielded good accuracy.

Original language	English (US)
Title of host publication	14th Topical Meeting on Electrical Performance of Electronic Packaging 2005
Pages	239-242
Number of pages	4
DOIs	https://doi.org/10.1109/EPEP.2005.1563747
State	Published - 2005
Event	14th Topical Meeting on Electrical Performance of Electronic Packaging 2005 - Austin, TX, United States Duration: Oct 24 2005 → Oct 26 2005

Publication series

Name	IEEE Topical Meeting on Electrical Performance of Electronic Packaging
Volume	2005

Conference

Conference	14th Topical Meeting on Electrical Performance of Electronic Packaging 2005
Country/Territory	United States
City	Austin, TX
Period	10/24/05 → 10/26/05

All Science Journal Classification (ASJC) codes

General Engineering

Access to Document

10.1109/EPEP.2005.1563747

Cite this

Mutnury, B., Swaminathan, M., Cases, M., Pham, N., De Araujo, D. N., & Matoglu, E. (2005). Scalable driver I/O macromodels for statistical analysis. In 14th Topical Meeting on Electrical Performance of Electronic Packaging 2005 (pp. 239-242). Article 1563747 (IEEE Topical Meeting on Electrical Performance of Electronic Packaging; Vol. 2005). https://doi.org/10.1109/EPEP.2005.1563747

@inproceedings{093620a4bc2c4def8b50bc073d4d1977,

title = "Scalable driver I/O macromodels for statistical analysis",

abstract = "In this paper, scalable driver I/O macromodels have been proposed for efficient signal integrity and timing analysis of today's high-speed systems. Variations in semiconductor process, temperature, and power supply voltage affect the output voltage and current in driver circuits. The effect of these variations on driver and receiver circuits has been captured using Lagrange's interpolation technique. In this paper, scalable macromodeling approach has been applied to differential driver circuits and single-ended driver and receiver circuits. Scalable driver and receiver circuits consume less CPU memory and simulation time compared to transistor-level driver and receiver circuits. The accuracy of scalable macromodels has been tested on various test cases for differential driver and single-ended driver-receiver circuits and results yielded good accuracy.",

author = "Bhyrav Mutnury and Madhavan Swaminathan and Moises Cases and Nam Pham and {De Araujo}, {Daniel N.} and Erdem Matoglu",

year = "2005",

doi = "10.1109/EPEP.2005.1563747",

language = "English (US)",

isbn = "0780392205",

series = "IEEE Topical Meeting on Electrical Performance of Electronic Packaging",

pages = "239--242",

booktitle = "14th Topical Meeting on Electrical Performance of Electronic Packaging 2005",

note = "14th Topical Meeting on Electrical Performance of Electronic Packaging 2005 ; Conference date: 24-10-2005 Through 26-10-2005",

}

Mutnury, B, Swaminathan, M, Cases, M, Pham, N, De Araujo, DN & Matoglu, E 2005, Scalable driver I/O macromodels for statistical analysis. in 14th Topical Meeting on Electrical Performance of Electronic Packaging 2005., 1563747, IEEE Topical Meeting on Electrical Performance of Electronic Packaging, vol. 2005, pp. 239-242, 14th Topical Meeting on Electrical Performance of Electronic Packaging 2005, Austin, TX, United States, 10/24/05. https://doi.org/10.1109/EPEP.2005.1563747

Scalable driver I/O macromodels for statistical analysis. / Mutnury, Bhyrav; Swaminathan, Madhavan; Cases, Moises et al.
14th Topical Meeting on Electrical Performance of Electronic Packaging 2005. 2005. p. 239-242 1563747 (IEEE Topical Meeting on Electrical Performance of Electronic Packaging; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Scalable driver I/O macromodels for statistical analysis

AU - Mutnury, Bhyrav

AU - Swaminathan, Madhavan

AU - Cases, Moises

AU - Pham, Nam

AU - De Araujo, Daniel N.

AU - Matoglu, Erdem

PY - 2005

Y1 - 2005

N2 - In this paper, scalable driver I/O macromodels have been proposed for efficient signal integrity and timing analysis of today's high-speed systems. Variations in semiconductor process, temperature, and power supply voltage affect the output voltage and current in driver circuits. The effect of these variations on driver and receiver circuits has been captured using Lagrange's interpolation technique. In this paper, scalable macromodeling approach has been applied to differential driver circuits and single-ended driver and receiver circuits. Scalable driver and receiver circuits consume less CPU memory and simulation time compared to transistor-level driver and receiver circuits. The accuracy of scalable macromodels has been tested on various test cases for differential driver and single-ended driver-receiver circuits and results yielded good accuracy.

AB - In this paper, scalable driver I/O macromodels have been proposed for efficient signal integrity and timing analysis of today's high-speed systems. Variations in semiconductor process, temperature, and power supply voltage affect the output voltage and current in driver circuits. The effect of these variations on driver and receiver circuits has been captured using Lagrange's interpolation technique. In this paper, scalable macromodeling approach has been applied to differential driver circuits and single-ended driver and receiver circuits. Scalable driver and receiver circuits consume less CPU memory and simulation time compared to transistor-level driver and receiver circuits. The accuracy of scalable macromodels has been tested on various test cases for differential driver and single-ended driver-receiver circuits and results yielded good accuracy.

UR - http://www.scopus.com/inward/record.url?scp=33845870905&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33845870905&partnerID=8YFLogxK

U2 - 10.1109/EPEP.2005.1563747

DO - 10.1109/EPEP.2005.1563747

M3 - Conference contribution

AN - SCOPUS:33845870905

SN - 0780392205

SN - 9780780392205

T3 - IEEE Topical Meeting on Electrical Performance of Electronic Packaging

SP - 239

EP - 242

BT - 14th Topical Meeting on Electrical Performance of Electronic Packaging 2005

T2 - 14th Topical Meeting on Electrical Performance of Electronic Packaging 2005

Y2 - 24 October 2005 through 26 October 2005

ER -

Scalable driver I/O macromodels for statistical analysis

Abstract

Publication series

Conference

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this