Scan chain fault identification using weight-based codes for SoC circuits

S. Ghosh, K. W. Lai, W. B. Jone, S. C. Chang

Research output: Contribution to journalConference articlepeer-review

5 Scopus citations


Recently, it has been observed that embedded cores in a high-speed SoC circuit have the problem of broken scan chains that cannot shift properly. Also, scan chain inter-mittent faults caused by hold-time violations and crosstalk noises are pervasive. In this research, an efficient method is proposed to identify the faulty scan chain(s) at the core level. That is, the core where the scan chain is defective can be identified, even if the scan chain is broken. The result can be used to tune up the fabrication process or to guide the fine-grained scan cell identification process. Here, weight-based m-out-of-n codes, which can generate a large number of codewords, with small hardware overhead and high fault detection capability are used to generate the scan chain diagnostic patterns for permanent (and possibly intermittent) faults. An efficient codeword generation method is proposed to maximize the number of codewords, minimize the aliasing probabilities and test application cost. The idea of multiple m-out-of-n codes is also proposed to guarantee that sufficient number of codewords are generated to perturb the scan chains and the associated combinational circuits. Simulation results demonstrate the feasibility of the proposed method.

Original languageEnglish (US)
Pages (from-to)210-215
Number of pages6
JournalProceedings of the Asian Test Symposium
StatePublished - 2004
EventProceedings of the Asian Test Symposium, ATS'04 - Kenting, Taiwan, Province of China
Duration: Nov 15 2004Nov 17 2004

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering


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