Scanning Hall probe microscopy of a diluted magnetic semiconductor

Seongsoo Kweon; Nitin Samarth; Alex De Lozanne

doi:10.1063/1.3122145

Scanning Hall probe microscopy of a diluted magnetic semiconductor

Seongsoo Kweon, Nitin Samarth, Alex De Lozanne

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3 Scopus citations

Abstract

We have measured the micromagnetic properties of a diluted magnetic semiconductor as a function of temperature and applied field with a scanning Hall probe microscope built in our laboratory. The design philosophy for this microscope and some details are described. The samples analyzed in this work are Ga_0.94 Mn_0.06 As films grown by molecular beam epitaxy. We find that the magnetic domains are 2-4 μm wide and fairly stable with temperature. Magnetic clusters are observed above TC, which we ascribe to MnAs defects too small and sparse to be detected by a superconducting quantum interference device magnetometer.

Original language	English (US)
Article number	093906
Journal	Journal of Applied Physics
Volume	105
Issue number	9
DOIs	https://doi.org/10.1063/1.3122145
State	Published - 2009

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1063/1.3122145

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title = "Scanning Hall probe microscopy of a diluted magnetic semiconductor",

abstract = "We have measured the micromagnetic properties of a diluted magnetic semiconductor as a function of temperature and applied field with a scanning Hall probe microscope built in our laboratory. The design philosophy for this microscope and some details are described. The samples analyzed in this work are Ga0.94 Mn0.06 As films grown by molecular beam epitaxy. We find that the magnetic domains are 2-4 μm wide and fairly stable with temperature. Magnetic clusters are observed above TC, which we ascribe to MnAs defects too small and sparse to be detected by a superconducting quantum interference device magnetometer.",

author = "Seongsoo Kweon and Nitin Samarth and {De Lozanne}, Alex",

note = "Funding Information: We thank Professor John Markert for the use of the SQUID magnetometer, and Suenne Kim and Federico Castro for help with some of the early stages of this project. This work is supported by the National Science Foundation (Grant No. DMR-0308575) and the Welch Foundation (Grant No. F-1533).",

year = "2009",

doi = "10.1063/1.3122145",

language = "English (US)",

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journal = "Journal of Applied Physics",

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T1 - Scanning Hall probe microscopy of a diluted magnetic semiconductor

AU - Kweon, Seongsoo

AU - Samarth, Nitin

AU - De Lozanne, Alex

N1 - Funding Information: We thank Professor John Markert for the use of the SQUID magnetometer, and Suenne Kim and Federico Castro for help with some of the early stages of this project. This work is supported by the National Science Foundation (Grant No. DMR-0308575) and the Welch Foundation (Grant No. F-1533).

PY - 2009

Y1 - 2009

N2 - We have measured the micromagnetic properties of a diluted magnetic semiconductor as a function of temperature and applied field with a scanning Hall probe microscope built in our laboratory. The design philosophy for this microscope and some details are described. The samples analyzed in this work are Ga0.94 Mn0.06 As films grown by molecular beam epitaxy. We find that the magnetic domains are 2-4 μm wide and fairly stable with temperature. Magnetic clusters are observed above TC, which we ascribe to MnAs defects too small and sparse to be detected by a superconducting quantum interference device magnetometer.

AB - We have measured the micromagnetic properties of a diluted magnetic semiconductor as a function of temperature and applied field with a scanning Hall probe microscope built in our laboratory. The design philosophy for this microscope and some details are described. The samples analyzed in this work are Ga0.94 Mn0.06 As films grown by molecular beam epitaxy. We find that the magnetic domains are 2-4 μm wide and fairly stable with temperature. Magnetic clusters are observed above TC, which we ascribe to MnAs defects too small and sparse to be detected by a superconducting quantum interference device magnetometer.

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DO - 10.1063/1.3122145

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JF - Journal of Applied Physics

IS - 9

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Scanning Hall probe microscopy of a diluted magnetic semiconductor

Abstract

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