Scanning the Issue

W. Liu; M. John; A. Karrenbauer; A. Allerhand; F. Lombardi; M. Shulte; D. J. Miller; Z. Xiang; G. Kesidis; A. Oulasvirta; N. R. Dayama; M. Shiripour

doi:10.1109/JPROC.2020.2975522

Scanning the Issue

W. Liu, M. John, A. Karrenbauer, A. Allerhand, F. Lombardi, M. Shulte, D. J. Miller, Z. Xiang, G. Kesidis, A. Oulasvirta, N. R. Dayama, M. Shiripour

Research output: Contribution to journal › Review article › peer-review

Abstract

Computing systems have been facing severe technology challenges in recent years with regard to power consumption, circuit reliability, and high performance. For many years, the issues of power consumption and performance have been addressed with the use of technology scaling.However, as Dennard's scaling tends toward an end, it has become difficult to further improve the performance under the same power constraints. In addition to power, reliability also becomes a critical issue when the feature size of the complementary metal-oxide-semiconductor (CMOS) technology is reduced below 7 nm. Thus, ensuring the complete accuracy of the signal has become increasingly challenging in recent years.

Original language	English (US)
Article number	9024191
Pages (from-to)	400-401
Number of pages	2
Journal	Proceedings of the IEEE
Volume	108
Issue number	3
DOIs	https://doi.org/10.1109/JPROC.2020.2975522
State	Published - Mar 2020

All Science Journal Classification (ASJC) codes

Computer Science(all)
Electrical and Electronic Engineering

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10.1109/JPROC.2020.2975522

Cite this

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title = "Scanning the Issue",

abstract = "Computing systems have been facing severe technology challenges in recent years with regard to power consumption, circuit reliability, and high performance. For many years, the issues of power consumption and performance have been addressed with the use of technology scaling.However, as Dennard's scaling tends toward an end, it has become difficult to further improve the performance under the same power constraints. In addition to power, reliability also becomes a critical issue when the feature size of the complementary metal-oxide-semiconductor (CMOS) technology is reduced below 7 nm. Thus, ensuring the complete accuracy of the signal has become increasingly challenging in recent years.",

author = "W. Liu and M. John and A. Karrenbauer and A. Allerhand and F. Lombardi and M. Shulte and Miller, {D. J.} and Z. Xiang and G. Kesidis and A. Oulasvirta and Dayama, {N. R.} and M. Shiripour",

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language = "English (US)",

volume = "108",

pages = "400--401",

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T1 - Scanning the Issue

AU - Liu, W.

AU - John, M.

AU - Karrenbauer, A.

AU - Allerhand, A.

AU - Lombardi, F.

AU - Shulte, M.

AU - Miller, D. J.

AU - Xiang, Z.

AU - Kesidis, G.

AU - Oulasvirta, A.

AU - Dayama, N. R.

AU - Shiripour, M.

PY - 2020/3

Y1 - 2020/3

N2 - Computing systems have been facing severe technology challenges in recent years with regard to power consumption, circuit reliability, and high performance. For many years, the issues of power consumption and performance have been addressed with the use of technology scaling.However, as Dennard's scaling tends toward an end, it has become difficult to further improve the performance under the same power constraints. In addition to power, reliability also becomes a critical issue when the feature size of the complementary metal-oxide-semiconductor (CMOS) technology is reduced below 7 nm. Thus, ensuring the complete accuracy of the signal has become increasingly challenging in recent years.

AB - Computing systems have been facing severe technology challenges in recent years with regard to power consumption, circuit reliability, and high performance. For many years, the issues of power consumption and performance have been addressed with the use of technology scaling.However, as Dennard's scaling tends toward an end, it has become difficult to further improve the performance under the same power constraints. In addition to power, reliability also becomes a critical issue when the feature size of the complementary metal-oxide-semiconductor (CMOS) technology is reduced below 7 nm. Thus, ensuring the complete accuracy of the signal has become increasingly challenging in recent years.

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Scanning the Issue

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