Abstract
Most current micro/nanoelectromechanical systems (MEMS/NEMS) are based on silicon. However, silicon exhibits relatively poor mechanical/tribological properties, compromising applications to some devices. Diamond films with superior mechanical/tribological properties provide an excellent alternative platform material. Ultrananocrystalline diamond (UNCD®) in film form with 2-5 nm grains exhibits excellent mechanical and tribological properties for high-performance MEMS/NEMS devices. Concurrently, piezoelectric Pb(Zr xTi1-x)O3 (PZT) films provide high sensitivity/low electrical noise for sensing/high-force actuation at relatively low voltages. Therefore, integration of PZT and UNCD films provides a high-performance platform for advanced MEMS/NEMS devices. This paper describes the bases of such integration and demonstration of low voltage piezoactuated hybrid PZT/UNCD cantilevers.
| Original language | English (US) |
|---|---|
| Title of host publication | Microelectromechanical Systems - Materials and Devices |
| Pages | 259-264 |
| Number of pages | 6 |
| Volume | 1052 |
| State | Published - 2008 |
| Event | Microelectromechanical Systems - Materials and Devices - Boston, MA, United States Duration: Nov 26 2007 → Nov 28 2007 |
Other
| Other | Microelectromechanical Systems - Materials and Devices |
|---|---|
| Country/Territory | United States |
| City | Boston, MA |
| Period | 11/26/07 → 11/28/07 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials