Seabed roughness parameters for the Malta Plateau from joint backscatter and reflection inversion

Gavin Steininger, Charles W. Holland, Stan E. Dosso, Jan Dettmer

Research output: Contribution to journalConference articlepeer-review


This paper presents seabed interface-scattering and geoacoustic parameters estimated on the Malta Plateau, Mediterranean Sea, by joint Bayesian inversion of monostatic backscatter and spherical-wave reflection-coefficient data. The data are modeled assuming a stack of homogeneous fluid sediment layers overlying an elastic basement. The scattering model also assumes a randomly rough water-sediment interface with a von Karman roughness power spectrum. Scattering and reflection data are inverted simultaneously using a population of interacting Markov-chains to sample roughness and geoacoustic parameters as well as residual error parameters. Trans-dimensional sampling is applied to treat the unknown number of sediment layers and unknown autoregressive order of the errors (to represent residual correlation). Results are considered in terms of marginal posterior probability profiles and distributions, which quantify the effective data information content to resolve scattering/geoacoustic parameters and structure. Results indicate well-defined scattering (roughness) parameters in good agreement with existing measurements, and a multi-layer sediment profile over a high-speed (elastic) basement, consistent with independent knowledge of sand layers over limestone.

Original languageEnglish (US)
Article number070003
JournalProceedings of Meetings on Acoustics
StatePublished - 2013
Event21st International Congress on Acoustics, ICA 2013 - 165th Meeting of the Acoustical Society of America - Montreal, QC, Canada
Duration: Jun 2 2013Jun 7 2013

All Science Journal Classification (ASJC) codes

  • Acoustics and Ultrasonics


Dive into the research topics of 'Seabed roughness parameters for the Malta Plateau from joint backscatter and reflection inversion'. Together they form a unique fingerprint.

Cite this