Shared scratch-pad memory space management

Ozcan Ozturk, Mahmut Kandemir, Ibrahim Kolcu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

29 Scopus citations

Abstract

Scratch-pad memories (SPMs) are important storage components in many embedded applications and used as an alternative or a complimentary storage to on-chip cache memories. One of the most critical issues in the context of SPMs is to select the data elements to place in them since the gap between SPM access latencies and off-chip memory access latencies keep increasing dramatically. Previous research considered this problem and attacked it using both static and dynamic schemes. Most of the prior efforts on data SPMs have mainly focused on single application scenarios, i.e., the SPM space available is assumed to be managed by a single application at any given time. While this assumption makes sense in certain domains, there also exist many cases where multiple applications need to share the same SPM space. This paper focuses on such a multi-application scenario and proposes a nonuniform SPM space partitioning and management across concurrently-executing applications. In our approach, the amount of data to be allocated to each application is decided based on the data reuse each application exhibits.

Original languageEnglish (US)
Title of host publicationProceedings - 7th International Symposium on Quality Electronic Design, ISQED 2006
Pages576-584
Number of pages9
DOIs
StatePublished - 2006
Event7th International Symposium on Quality Electronic Design, ISQED 2006 - San Jose, CA, United States
Duration: Mar 27 2006Mar 29 2006

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Other

Other7th International Symposium on Quality Electronic Design, ISQED 2006
Country/TerritoryUnited States
CitySan Jose, CA
Period3/27/063/29/06

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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