TY - GEN
T1 - Side channel attacks on STTRAM and low-overhead countermeasures
AU - Iyengar, Anirudh
AU - Ghosh, Swaroop
AU - Rathi, Nitin
AU - Naeimi, Helia
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/10/25
Y1 - 2016/10/25
N2 - Spin-Torque Transfer RAM (STTRAM) is a promising candidate for last level cache due to its high density, high endurance and low leakage. Although promising, STTRAM suffers from high write latency and write current. Additionally, the latency and current depends on the polarity of the data being written. These factors introduce security vulnerabilities and expose the cache memory to side channel attacks (SCA). In this paper we propose a SCA model where the adversary can monitor the supply current of the memory array to partially identify the sensitive cache data that is being read or written. We propose a suite of low-cost solutions such as short retention STTRAM, obfuscation of side channel using 1-bit parity and multi-bit random write, and, neutralizing the side channel using constant current write driver to mitigate the attack. Our analysis reveal that the 1-bit parity reduces the number of distinct write current states by 30% for 32-bit word and the current signature is further obfuscated by multi-bit random writes. Constant current write makes it more challenging for the attacker to extract the entire word using a single supply current signature.
AB - Spin-Torque Transfer RAM (STTRAM) is a promising candidate for last level cache due to its high density, high endurance and low leakage. Although promising, STTRAM suffers from high write latency and write current. Additionally, the latency and current depends on the polarity of the data being written. These factors introduce security vulnerabilities and expose the cache memory to side channel attacks (SCA). In this paper we propose a SCA model where the adversary can monitor the supply current of the memory array to partially identify the sensitive cache data that is being read or written. We propose a suite of low-cost solutions such as short retention STTRAM, obfuscation of side channel using 1-bit parity and multi-bit random write, and, neutralizing the side channel using constant current write driver to mitigate the attack. Our analysis reveal that the 1-bit parity reduces the number of distinct write current states by 30% for 32-bit word and the current signature is further obfuscated by multi-bit random writes. Constant current write makes it more challenging for the attacker to extract the entire word using a single supply current signature.
UR - http://www.scopus.com/inward/record.url?scp=84999188198&partnerID=8YFLogxK
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U2 - 10.1109/DFT.2016.7684086
DO - 10.1109/DFT.2016.7684086
M3 - Conference contribution
AN - SCOPUS:84999188198
T3 - 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016
SP - 141
EP - 146
BT - 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 29th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016
Y2 - 19 September 2016 through 20 September 2016
ER -