Simultaneous determination of sample thickness, tilt, and electron mean free path using tomographic tilt images based on Beer-Lambert law
- Rui Yan
- , Thomas J. Edwards
- , Logan M. Pankratz
- , Richard J. Kuhn
- , Jason K. Lanman
- , Jun Liu
- , Wen Jiang
Research output: Contribution to journal › Article › peer-review
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