TY - JOUR
T1 - Single-particle cryo-EM data acquisition by using direct electron detection camera
AU - Wu, Shenping
AU - Armache, Jean Paul
AU - Cheng, Yifan
N1 - Publisher Copyright:
© The Author 2015. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: [email protected].
PY - 2016/2/1
Y1 - 2016/2/1
N2 - Recent advances in single-particle electron cryo-microscopy (cryo-EM) were largely facilitated by the application of direct electron detection cameras. These cameras feature not only a significant improvement in detective quantum efficiency but also a high frame rate that enables images to be acquired as 'movies' made of stacks of many frames. In this review, we discuss how the applications of direct electron detection cameras in cryo-EM have changed the way the data are acquired.
AB - Recent advances in single-particle electron cryo-microscopy (cryo-EM) were largely facilitated by the application of direct electron detection cameras. These cameras feature not only a significant improvement in detective quantum efficiency but also a high frame rate that enables images to be acquired as 'movies' made of stacks of many frames. In this review, we discuss how the applications of direct electron detection cameras in cryo-EM have changed the way the data are acquired.
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U2 - 10.1093/jmicro/dfv355
DO - 10.1093/jmicro/dfv355
M3 - Review article
C2 - 26546989
AN - SCOPUS:85017194491
SN - 2050-5698
VL - 65
SP - 35
EP - 41
JO - Microscopy (Oxford, England)
JF - Microscopy (Oxford, England)
IS - 1
ER -