TY - GEN
T1 - Size reduction of electromagnetic bandgap (EBG) structures with new geometries and materials
AU - Toyota, Yoshitaka
AU - Engin, A. Ege
AU - Kim, Tae Hong
AU - Swaminathan, Madhavan
AU - Bhattacharya, Swapan
PY - 2006
Y1 - 2006
N2 - Size reduction of an electromagnetic bandgap (EBG) structure with large patches and small branches that connect adjacent patches for a power/ground plane pair is studied. To shrink the dimensions with a high isolation at the frequency of interest, this paper provides two approaches. One is a geometric approach which is to place two narrow slits on each patch. The increase of branch inductance with the long slit successfully decreases the on-set frequency of the stopband without increasing the patch size. The other approach is to use high-K material for a thin dielectric layer. In this case, the size reduction can be predicted according to a scaling law. These approaches are applied together to realize an EBG structure with the entire size of less than 20 mm on a side. It covers the GSM band with sufficient isolation. Through this study, the dispersion-diagram analysis is used to predict the stopband characteristics.
AB - Size reduction of an electromagnetic bandgap (EBG) structure with large patches and small branches that connect adjacent patches for a power/ground plane pair is studied. To shrink the dimensions with a high isolation at the frequency of interest, this paper provides two approaches. One is a geometric approach which is to place two narrow slits on each patch. The increase of branch inductance with the long slit successfully decreases the on-set frequency of the stopband without increasing the patch size. The other approach is to use high-K material for a thin dielectric layer. In this case, the size reduction can be predicted according to a scaling law. These approaches are applied together to realize an EBG structure with the entire size of less than 20 mm on a side. It covers the GSM band with sufficient isolation. Through this study, the dispersion-diagram analysis is used to predict the stopband characteristics.
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U2 - 10.1109/ECTC.2006.1645901
DO - 10.1109/ECTC.2006.1645901
M3 - Conference contribution
AN - SCOPUS:33845571267
SN - 1424401526
SN - 9781424401529
T3 - Proceedings - Electronic Components and Technology Conference
SP - 1784
EP - 1789
BT - Proceedings - IEEE 56th Electronic Components and Technology Conference
T2 - IEEE 56th Electronic Components and Technology Conference
Y2 - 30 May 2006 through 2 June 2006
ER -