Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station
- Duane J. McCrory
- , Mark A. Anders
- , Jason T. Ryan
- , Pragya R. Shrestha
- , Kin P. Cheung
- , Patrick M. Lenahan
- , Jason P. Campbell
Research output: Contribution to journal › Article › peer-review
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