Sodium, rubidium and cesium in the gate oxides of SiC MOSFETs

B. R. Tuttle, S. Dhar, S. H. Ryu, X. Zhu, J. R. Williams, L. C. Feldman, S. T. Pantelides

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Fingerprint

Dive into the research topics of 'Sodium, rubidium and cesium in the gate oxides of SiC MOSFETs'. Together they form a unique fingerprint.

Keyphrases

Material Science

Chemistry

Engineering

Physics

Earth and Planetary Sciences