Original language | English (US) |
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Title of host publication | IEEE International Test Conference, Proceedings, ITC 2005 |
Pages | 1270-1271 |
Number of pages | 2 |
DOIs | |
State | Published - 2005 |
Event | IEEE International Test Conference, ITC 2005 - Austin, TX, United States Duration: Nov 8 2005 → Nov 10 2005 |
Publication series
Name | Proceedings - International Test Conference |
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Volume | 2005 |
ISSN (Print) | 1089-3539 |
Other
Other | IEEE International Test Conference, ITC 2005 |
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Country/Territory | United States |
City | Austin, TX |
Period | 11/8/05 → 11/10/05 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
- Applied Mathematics