Soft errors: Is the concern for soft-errors overblown?

N. Vijaykrishnan

doi:10.1109/TEST.2005.1584102

Soft errors: Is the concern for soft-errors overblown?

N. Vijaykrishnan

Computer Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Scopus citations

Original language	English (US)
Title of host publication	IEEE International Test Conference, Proceedings, ITC 2005
Pages	1270-1271
Number of pages	2
DOIs	https://doi.org/10.1109/TEST.2005.1584102
State	Published - 2005
Event	IEEE International Test Conference, ITC 2005 - Austin, TX, United States Duration: Nov 8 2005 → Nov 10 2005

Publication series

Name	Proceedings - International Test Conference
Volume	2005
ISSN (Print)	1089-3539

Other

Other	IEEE International Test Conference, ITC 2005
Country/Territory	United States
City	Austin, TX
Period	11/8/05 → 11/10/05

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Applied Mathematics

Access to Document

10.1109/TEST.2005.1584102

Cite this

@inproceedings{e5a66d66b695410fa00efc9e646aba5f,

title = "Soft errors: Is the concern for soft-errors overblown?",

author = "N. Vijaykrishnan",

year = "2005",

doi = "10.1109/TEST.2005.1584102",

language = "English (US)",

isbn = "0780390393",

series = "Proceedings - International Test Conference",

pages = "1270--1271",

booktitle = "IEEE International Test Conference, Proceedings, ITC 2005",

note = "IEEE International Test Conference, ITC 2005 ; Conference date: 08-11-2005 Through 10-11-2005",

}

TY - GEN

T1 - Soft errors

T2 - IEEE International Test Conference, ITC 2005

AU - Vijaykrishnan, N.

PY - 2005

Y1 - 2005

UR - https://www.scopus.com/pages/publications/33847140206

UR - https://www.scopus.com/pages/publications/33847140206#tab=citedBy

U2 - 10.1109/TEST.2005.1584102

DO - 10.1109/TEST.2005.1584102

M3 - Conference contribution

AN - SCOPUS:33847140206

SN - 0780390393

SN - 9780780390393

T3 - Proceedings - International Test Conference

SP - 1270

EP - 1271

BT - IEEE International Test Conference, Proceedings, ITC 2005

Y2 - 8 November 2005 through 10 November 2005

ER -

Soft errors: Is the concern for soft-errors overblown?

Publication series

Other

All Science Journal Classification (ASJC) codes

Access to Document

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Cite this