Soft x-ray vector ptycho-tomography: a new quantitative vector nanoimaging method for spin textures in 3D

Chen Ting Liao, Arjun Rana, Ezio Iacocca, Ji Zou, Minh Pham, Xingyuan Lu, Emma Elizabeth Cating Subramanian, Yuan Hung Lo, Sinéad A. Ryan, Charles S. Bevis, Robert M. Karl, Andrew J. Glaid, Jeffrey Rable, Pratibha Mahale, Joel Hirst, Thomas Ostler, William Liu, Colum M.O. Leary, Young Sang Yu, Karen BustilloHendrik Ohldag, David A. Shapiro, Sadegh Yazdi, Thomas E. Mallouk, Stanley J. Osher, Henry C. Kapteyn, Vincent H. Crespi, John V. Badding, Yaroslav Tserkovnyak, Margaret M. Murnane, Jianwei Miao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Understanding topological spin textures is important because of scientific interests and technological applications. However, observing nanoscale magnetization and mapping out their interactions in 3D have been challenging – due to the lack of nondestructive vector nanoimaging techniques that penetrate thick samples. Recently, we developed a new characterization technique, soft x-ray vector ptycho-tomography, to image spin textures with a 3D vector spatial resolution of 10 nm. Using 3D magnetic metamaterial as an example, we demonstrated the creation and observation of topological magnetic monopoles and their interactions. We expect this method to be applied broadly to image vector fields in magnetic samples and beyond.

Original languageEnglish (US)
Title of host publicationSpintronics XVI
EditorsJean-Eric Wegrowe, Joseph S. Friedman, Manijeh Razeghi
PublisherSPIE
ISBN (Electronic)9781510665262
DOIs
StatePublished - 2023
EventSpintronics XVI 2023 - San Diego, United States
Duration: Aug 20 2023Aug 24 2023

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12656
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceSpintronics XVI 2023
Country/TerritoryUnited States
CitySan Diego
Period8/20/238/24/23

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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