Abstract
Ferroelectric SrBi2Ta2O9 thin films were prepared from Sr metals, Ta-ethoxide and Bi, 2-ethylhexanoate. The films were prepared from both stoichiometric and 10 mol% Bi rich solutions. The stoichiometric film crystallized at 800°C had a spontaneous polarization value of 5 μC/cm2. The Bi rich film had lower crystallinity, finer grains and a smaller polarization. It was found to be necessary to anneal the films at high temperatures or for long time to achieve ferroelectricity. The non-crystalline states of sol-gel derived films differ from that observed in films deposited by physical vapor deposition. Crack free films were produced with the film thicknesses of 0.4 μm.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 41-45 |
| Number of pages | 5 |
| Journal | Ferroelectrics, Letters Section |
| Volume | 22 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - 1996 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
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