Solid solubility and precipitation in a single-crystal alumina-zirconia system

Matthew A. Stough; John R. Hellmann

doi:10.1111/j.1151-2916.2002.tb00553.x

Solid solubility and precipitation in a single-crystal alumina-zirconia system

Matthew A. Stough, John R. Hellmann

Research output: Contribution to journal › Article › peer-review

30 Scopus citations

Abstract

Solid solubility was examined in Zr-doped sapphire and Al-doped yttria-stabilized zirconia (YSZ) single crystals from 1200° to 1600°C. Specimens were fabricated via ion implantation of single crystals, followed by annealing in air. Secondary ion mass spectroscopy (SIMS) was used to quantify solute redistribution during annealing. Comparison of SIMS results with analytical electron microscopy (AEM) revealed an alumina solubility of 0.2-0.3 wt% in zirconia, and a zirconia solubility of 0.004-0.027 wt% in alumina. Direct imaging of zirconia precipitates revealed that tetragonal zirconia precipitates from supersaturated sapphire with the following orientation relationship: (100)_tetragonal ∥ (0001)_sapphire and [01̄1]_tetragonal ∥ [12̄10]_sapphire.

Original language	English (US)
Pages (from-to)	2895-2902
Number of pages	8
Journal	Journal of the American Ceramic Society
Volume	85
Issue number	12
DOIs	https://doi.org/10.1111/j.1151-2916.2002.tb00553.x
State	Published - Dec 2002

All Science Journal Classification (ASJC) codes

Ceramics and Composites
Materials Chemistry

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10.1111/j.1151-2916.2002.tb00553.x

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title = "Solid solubility and precipitation in a single-crystal alumina-zirconia system",

abstract = "Solid solubility was examined in Zr-doped sapphire and Al-doped yttria-stabilized zirconia (YSZ) single crystals from 1200° to 1600°C. Specimens were fabricated via ion implantation of single crystals, followed by annealing in air. Secondary ion mass spectroscopy (SIMS) was used to quantify solute redistribution during annealing. Comparison of SIMS results with analytical electron microscopy (AEM) revealed an alumina solubility of 0.2-0.3 wt% in zirconia, and a zirconia solubility of 0.004-0.027 wt% in alumina. Direct imaging of zirconia precipitates revealed that tetragonal zirconia precipitates from supersaturated sapphire with the following orientation relationship: (100)tetragonal ∥ (0001)sapphire and [0{\=1}1]tetragonal ∥ [1{\=2}10]sapphire.",

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T1 - Solid solubility and precipitation in a single-crystal alumina-zirconia system

AU - Stough, Matthew A.

AU - Hellmann, John R.

PY - 2002/12

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N2 - Solid solubility was examined in Zr-doped sapphire and Al-doped yttria-stabilized zirconia (YSZ) single crystals from 1200° to 1600°C. Specimens were fabricated via ion implantation of single crystals, followed by annealing in air. Secondary ion mass spectroscopy (SIMS) was used to quantify solute redistribution during annealing. Comparison of SIMS results with analytical electron microscopy (AEM) revealed an alumina solubility of 0.2-0.3 wt% in zirconia, and a zirconia solubility of 0.004-0.027 wt% in alumina. Direct imaging of zirconia precipitates revealed that tetragonal zirconia precipitates from supersaturated sapphire with the following orientation relationship: (100)tetragonal ∥ (0001)sapphire and [01̄1]tetragonal ∥ [12̄10]sapphire.

AB - Solid solubility was examined in Zr-doped sapphire and Al-doped yttria-stabilized zirconia (YSZ) single crystals from 1200° to 1600°C. Specimens were fabricated via ion implantation of single crystals, followed by annealing in air. Secondary ion mass spectroscopy (SIMS) was used to quantify solute redistribution during annealing. Comparison of SIMS results with analytical electron microscopy (AEM) revealed an alumina solubility of 0.2-0.3 wt% in zirconia, and a zirconia solubility of 0.004-0.027 wt% in alumina. Direct imaging of zirconia precipitates revealed that tetragonal zirconia precipitates from supersaturated sapphire with the following orientation relationship: (100)tetragonal ∥ (0001)sapphire and [01̄1]tetragonal ∥ [12̄10]sapphire.

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ER -

Solid solubility and precipitation in a single-crystal alumina-zirconia system

Abstract

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