Abstract
Alloying β-(AlxGa1-x)2O3 on a β-Ga2O3 substrate results in a heterojunction with a tunable bandgap, but is often plagued by defects in the interface region. In this work, using valence electron energy loss spectroscopy combined with density functional theory calculations, we identify a high concentration of cation interstitials at a β-(Al0.2Ga0.8)2O3/β-Ga2O3 interface and measure the optical absorption edge. We find a dip in the band edge of 0.1 eV depth and a width of around 15 nm on the β-Ga2O3 side of the interface with signs of noticeable electron probe delocalization broadening and discuss defect states versus excitons as its possible origins.
Original language | English (US) |
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Pages (from-to) | 585-591 |
Number of pages | 7 |
Journal | ACS Applied Electronic Materials |
Volume | 4 |
Issue number | 2 |
DOIs | |
State | Published - Feb 22 2022 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Materials Chemistry
- Electrochemistry