TY - GEN
T1 - Specific emitter identification using nonlinear device estimation
AU - Liu, Ming Wei
AU - Doherty, John F.
PY - 2008
Y1 - 2008
N2 - Specific Emitter Identification (SEI) identines radio emitters of interest using only external signal feature measurements. SEI can be used for intelligent gathering, network intrusion detection, battle field management, etc. Although abundant researches have been well developed, most of them are not associated with civil commercial products but radars. In this paper, we propose a method which estimates the power series coefficients of nonlinear devices in the Radio Frequency (RF) front end by observing the spectral regrowth. This external feature is unique due to different system designs and fabrication randomness. The performance of the technique is analyzed and experimented under AWGN channel based on an OFDM system, IEEE 802.11a/g, in both fixed and various transmitted power scenarios.
AB - Specific Emitter Identification (SEI) identines radio emitters of interest using only external signal feature measurements. SEI can be used for intelligent gathering, network intrusion detection, battle field management, etc. Although abundant researches have been well developed, most of them are not associated with civil commercial products but radars. In this paper, we propose a method which estimates the power series coefficients of nonlinear devices in the Radio Frequency (RF) front end by observing the spectral regrowth. This external feature is unique due to different system designs and fabrication randomness. The performance of the technique is analyzed and experimented under AWGN channel based on an OFDM system, IEEE 802.11a/g, in both fixed and various transmitted power scenarios.
UR - http://www.scopus.com/inward/record.url?scp=49049109324&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=49049109324&partnerID=8YFLogxK
U2 - 10.1109/SARNOF.2008.4520119
DO - 10.1109/SARNOF.2008.4520119
M3 - Conference contribution
AN - SCOPUS:49049109324
SN - 1424418437
SN - 9781424418435
T3 - Proceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF
BT - Proceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF
T2 - 2008 IEEE Sarnoff Symposium, SARNOFF
Y2 - 28 April 2008 through 30 April 2008
ER -