Spectroscopic ellipsometry studies of ferroelectric surfaces and thin films

Susan E. Trolier-McKinstry

Spectroscopic ellipsometry studies of ferroelectric surfaces and thin films

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Spectroscopic ellipsometry was used to investigate the surface properties of a c-axis oriented top seeded grown BaTiO₃ crystals and a lead lanthanum zirconate titanate ceramic as a function of the surface preparation conditions. In addition, perovskite thin films grown by several different techniques have been depth profiled in order to relate the microstructure to the observed electrical properties.

Original language	English (US)
Title of host publication	Proceedings - Annual Meeting, Microscopy Society of America
Editors	G.W. Bailey, A.J. Garratt-Reed
Pages	570-571
Number of pages	2
State	Published - 1994
Event	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994

Other

Other	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America
City	New Orleans, LA, USA
Period	7/31/94 → 8/5/94

All Science Journal Classification (ASJC) codes

General Engineering

Cite this

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title = "Spectroscopic ellipsometry studies of ferroelectric surfaces and thin films",

abstract = "Spectroscopic ellipsometry was used to investigate the surface properties of a c-axis oriented top seeded grown BaTiO3 crystals and a lead lanthanum zirconate titanate ceramic as a function of the surface preparation conditions. In addition, perovskite thin films grown by several different techniques have been depth profiled in order to relate the microstructure to the observed electrical properties.",

author = "Trolier-McKinstry, {Susan E.}",

year = "1994",

language = "English (US)",

pages = "570--571",

editor = "G.W. Bailey and A.J. Garratt-Reed",

booktitle = "Proceedings - Annual Meeting, Microscopy Society of America",

note = "Proceedings of the 52nd Annual Meeting of the Microscopy Society of America ; Conference date: 31-07-1994 Through 05-08-1994",

}

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T1 - Spectroscopic ellipsometry studies of ferroelectric surfaces and thin films

AU - Trolier-McKinstry, Susan E.

PY - 1994

Y1 - 1994

N2 - Spectroscopic ellipsometry was used to investigate the surface properties of a c-axis oriented top seeded grown BaTiO3 crystals and a lead lanthanum zirconate titanate ceramic as a function of the surface preparation conditions. In addition, perovskite thin films grown by several different techniques have been depth profiled in order to relate the microstructure to the observed electrical properties.

AB - Spectroscopic ellipsometry was used to investigate the surface properties of a c-axis oriented top seeded grown BaTiO3 crystals and a lead lanthanum zirconate titanate ceramic as a function of the surface preparation conditions. In addition, perovskite thin films grown by several different techniques have been depth profiled in order to relate the microstructure to the observed electrical properties.

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UR - http://www.scopus.com/inward/citedby.url?scp=0028736984&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0028736984

SP - 570

EP - 571

BT - Proceedings - Annual Meeting, Microscopy Society of America

A2 - Bailey, G.W.

A2 - Garratt-Reed, A.J.

T2 - Proceedings of the 52nd Annual Meeting of the Microscopy Society of America

Y2 - 31 July 1994 through 5 August 1994

ER -

Spectroscopic ellipsometry studies of ferroelectric surfaces and thin films

Abstract

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All Science Journal Classification (ASJC) codes

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