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Spectroscopy of point defects in semiconductors
Matthew D. McCluskey
, Michael A. Reshchikov
, Hemant Ghadi
, Joe F. McGlone
, Steven A. Ringel
,
Patrick M. Lenahan
, Kai Mei C. Fu
, Filip Tuomisto
Engineering Science and Mechanics
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Keyphrases
Defective Semiconductor
100%
Photoluminescence
50%
Electron Paramagnetic Resonance
50%
Spectroscopic Techniques
50%
Semiconductor Materials
50%
Infrared Transmission
50%
Positron Annihilation Spectroscopy
50%
Novel Phenomena
50%
Impurity Defects
50%
Native Defects
50%
Deep Level Transient Spectroscopy
50%
Chemistry
Spectroscopy
100%
Crystal Point Defect
100%
EPR Spectroscopy
50%
Optical Spectroscopy
50%
Photoluminescence
50%
Deep Level Transient Spectroscopy
50%
Magnetic Resonance
50%
Positron Annihilation
50%