Speedster-EXD: A new event-driven hybrid CMOS X-ray detector

Christopher V. Griffith, Abraham D. Falcone, Zachary R. Prieskorn, David N. Burrows

Research output: Contribution to journalArticlepeer-review

18 Scopus citations


The Speedster-EXD is a new 64×64 pixel2, 40-μm pixel pitch, 100-μm depletion depth hybrid CMOS X-ray detector with the capability of reading out only those pixels containing event charge, thus enabling fast effective frame rates. A global charge threshold can be specified, and pixels containing charge above this threshold are flagged and read out. The Speedster detector has also been designed with other advanced in-pixel features to improve performance, including a low-noise, high-gain capacitive transimpedance amplifier that eliminates interpixel capacitance crosstalk (IPC), and in-pixel correlated double sampling subtraction to reduce reset noise. We measure the best energy resolution on the Speedster-EXD detector to be 206 eV (3.5%) at 5.89 keV and 172 eV (10.0%) at 1.49 keV. The average IPC to the four adjacent pixels is measured to be 0.25%±0.2% (i.e., consistent with zero). The pixel-to-pixel gain variation is measured to be 0.80%±0.03%, and a Monte Carlo simulation is applied to better characterize the contributions to the energy resolution.

Original languageEnglish (US)
Article number016001
JournalJournal of Astronomical Telescopes, Instruments, and Systems
Issue number1
StatePublished - Jan 1 2016

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Control and Systems Engineering
  • Instrumentation
  • Astronomy and Astrophysics
  • Mechanical Engineering
  • Space and Planetary Science


Dive into the research topics of 'Speedster-EXD: A new event-driven hybrid CMOS X-ray detector'. Together they form a unique fingerprint.

Cite this