Abstract
Thin films of Sr2AlTaO6 (SAT) and multilayers of YBa2Cu3O7 (YBCO)/SAT have been grown by pulsed laser deposition on [001] LaAlO3 substrates. X-ray diffraction shows that SAT grows on [001] LaAlO3 with the c-axis oriented normal to the substrate plane. X-ray rocking curve and Rutherford backscattering channeling measurements on SAT films yield full width at half maximum of <0.3°and minimum backscattering yield χmin of 5%-7%, respectively, indicating good crystallinity. The real part of the dielectric constant εr is found to be ∼23-30, with ∼6×107 V/m static breakdown electric field. Both the dielectric constant and the static breakdown field show negligible temperature dependence between 10 and 300 K. A 100 nm×10 μm×50 μm YBCO film on SAT shows zero-field critical current density of ∼1.3×106 A/cm2 at 77 K, with a superconducting transition temperature Tc0 of ∼89.2 K.
Original language | English (US) |
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Pages (from-to) | 1718-1720 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 61 |
Issue number | 14 |
DOIs | |
State | Published - 1992 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)