Statistical analysis and diagnosis methodology for RF circuits in LCP substrates

Souvik Mukherjee, Madhavan Swaminathan, Erdem Matoglu

Research output: Contribution to journalArticlepeer-review

8 Scopus citations


This paper presents the application of a fast and accurate layout-level statistical analysis methodology for the diagnosis of RF circuit layouts with embedded passives in liquid crystalline polymer substrates. The approach is based on layout-segmentation, lumped-element modeling, sensitivity analysis, and extraction of probability density function using convolution methods. The statistical analyses were utilized as a diagnosis tool to estimate distributed design parameter variations and yield of RF circuit layouts for a given measured performance. The results of statistical analysis and diagnosis were compared with measurement results of fabricated filters. Statistical methods were also applied for design space exploration to improve system performance, as well as estimation of yield and diagnosis of faults during batch fabrication.

Original languageEnglish (US)
Pages (from-to)3621-3630
Number of pages10
JournalIEEE Transactions on Microwave Theory and Techniques
Issue number11
StatePublished - Nov 2005

All Science Journal Classification (ASJC) codes

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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