TY - JOUR
T1 - Steep switching hybrid phase transition FETs (Hyper-FET) for low power applications
T2 - A device-circuit co-design perspective - Part II
AU - Aziz, Ahmedullah
AU - Shukla, Nikhil
AU - Datta, Suman
AU - Gupta, Sumeet Kumar
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/3
Y1 - 2017/3
N2 - Hyper-FET, an emerging device with unconventional characteristics, exhibits sub-kT/q switching and can attain higher ON current (ION) than standard FinFETs with matched OFF current (IOFF). In continuation to the insights on the device level design methodology conveyed in part I [1], here we analyze the circuit implications of the unique characteristics of Hyper-FETs, such as hysteresis and abrupt switching. We provide a comprehensive discussion on the design of Hyper-FET-based circuit primitives, such as inverter, NOR and NAND gates. We emphasize on tailoring the hysteresis to avoid functional failure in logic circuits and deduce the correspondence between hysteresis observed in the device and circuit characteristics. To complement the device level constraints presented in part I, here we present additional stringencies for material parameters to aid in designing Hyper-FET-based logic gates with regenerative property and rail-to-railswing. Our analysis indicates that, at low VDD (<0.3 V), properly designed Hyper-FET-based inverters can exhibit 25%-68% less energy at iso-delay (compared with FinFET-based CMOS inverters). We also provide targets for future material exploration.
AB - Hyper-FET, an emerging device with unconventional characteristics, exhibits sub-kT/q switching and can attain higher ON current (ION) than standard FinFETs with matched OFF current (IOFF). In continuation to the insights on the device level design methodology conveyed in part I [1], here we analyze the circuit implications of the unique characteristics of Hyper-FETs, such as hysteresis and abrupt switching. We provide a comprehensive discussion on the design of Hyper-FET-based circuit primitives, such as inverter, NOR and NAND gates. We emphasize on tailoring the hysteresis to avoid functional failure in logic circuits and deduce the correspondence between hysteresis observed in the device and circuit characteristics. To complement the device level constraints presented in part I, here we present additional stringencies for material parameters to aid in designing Hyper-FET-based logic gates with regenerative property and rail-to-railswing. Our analysis indicates that, at low VDD (<0.3 V), properly designed Hyper-FET-based inverters can exhibit 25%-68% less energy at iso-delay (compared with FinFET-based CMOS inverters). We also provide targets for future material exploration.
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U2 - 10.1109/TED.2017.2650598
DO - 10.1109/TED.2017.2650598
M3 - Review article
AN - SCOPUS:85011655360
SN - 0018-9383
VL - 64
SP - 1358
EP - 1365
JO - IEEE Transactions on Electron Devices
JF - IEEE Transactions on Electron Devices
IS - 3
M1 - 7837676
ER -