Abstract
Qualitative and quantitative electron energy-loss spectroscopy analyses have been performed on niobium and stable niobium oxides (NbO, NbO2 and Nb2O5). At integration windows (Δ) greater than 75 eV, k-factor analysis can be used to distinguish between the stoichiometry of the three oxides within 5.7% error. As seen in other metal oxides, with increasing oxidation state the metal ionization edges shift to higher energies relative to the O-K edge. Normalized M2,3 white-line intensities show a strong correlation with 4d occupancy for each compound. The data are in correspondence with that observed in the literature for 4d transition metals using normalized L2,3 white lines. Lastly, a distinctive energy-loss near-edge, structure of the O-K edge was observed for each oxide, which could be used as a fingerprint for analysis of unknowns.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 233-241 |
| Number of pages | 9 |
| Journal | Journal of Microscopy |
| Volume | 224 |
| Issue number | 3 |
| DOIs | |
| State | Published - Dec 2006 |
All Science Journal Classification (ASJC) codes
- Pathology and Forensic Medicine
- Histology
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