Strain-induced crystal structure change in ultrathin films of Pr 0.7Sr0.3MnO3

Ian MacLaren; Zhong Lin Wang; H. S. Wang; Qi Li

doi:10.1063/1.1453482

Strain-induced crystal structure change in ultrathin films of Pr _0.7Sr_0.3MnO₃

Ian MacLaren
, Zhong Lin Wang
, H. S. Wang
, Qi Li

Physics

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

Ultrathin films (<30 nm) of Pr_0.7Sr_0.3MnO ₃ on LaAlO₃ have been studied using transmission electron microscopy (TEM). It was shown that the films are highly uniform and defect-free, and that they are coherently strained to the smaller lattice parameter of the substrate, resulting in a tetragonal expansion perpendicular to the film plane and a change of crystal structure from the ordered orthorhombic of bulk materials to a simple tetragonal perovskite. The variation of the tetragonality with distance from the interface was also determined from high-resolution TEM images.

Original language	English (US)
Pages (from-to)	1406-1408
Number of pages	3
Journal	Applied Physics Letters
Volume	80
Issue number	8
DOIs	https://doi.org/10.1063/1.1453482
State	Published - Feb 25 2002

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.1453482

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abstract = "Ultrathin films (<30 nm) of Pr0.7Sr0.3MnO 3 on LaAlO3 have been studied using transmission electron microscopy (TEM). It was shown that the films are highly uniform and defect-free, and that they are coherently strained to the smaller lattice parameter of the substrate, resulting in a tetragonal expansion perpendicular to the film plane and a change of crystal structure from the ordered orthorhombic of bulk materials to a simple tetragonal perovskite. The variation of the tetragonality with distance from the interface was also determined from high-resolution TEM images.",

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AU - MacLaren, Ian

AU - Wang, Zhong Lin

AU - Wang, H. S.

AU - Li, Qi

PY - 2002/2/25

Y1 - 2002/2/25

N2 - Ultrathin films (<30 nm) of Pr0.7Sr0.3MnO 3 on LaAlO3 have been studied using transmission electron microscopy (TEM). It was shown that the films are highly uniform and defect-free, and that they are coherently strained to the smaller lattice parameter of the substrate, resulting in a tetragonal expansion perpendicular to the film plane and a change of crystal structure from the ordered orthorhombic of bulk materials to a simple tetragonal perovskite. The variation of the tetragonality with distance from the interface was also determined from high-resolution TEM images.

AB - Ultrathin films (<30 nm) of Pr0.7Sr0.3MnO 3 on LaAlO3 have been studied using transmission electron microscopy (TEM). It was shown that the films are highly uniform and defect-free, and that they are coherently strained to the smaller lattice parameter of the substrate, resulting in a tetragonal expansion perpendicular to the film plane and a change of crystal structure from the ordered orthorhombic of bulk materials to a simple tetragonal perovskite. The variation of the tetragonality with distance from the interface was also determined from high-resolution TEM images.

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JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 8

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Strain-induced crystal structure change in ultrathin films of Pr _0.7Sr_0.3MnO₃

Abstract

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