Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films

H. W. Jang; S. H. Baek; D. Ortiz; C. M. Folkman; R. R. Das; Y. H. Chu; P. Shafer; J. X. Zhang; S. Choudhury; V. Vaithyanathan; Y. B. Chen; D. A. Felker; M. D. Biegalski; M. S. Rzchowski; X. Q. Pan; D. G. Schlom; L. Q. Chen; R. Ramesh; C. B. Eom

doi:10.1103/PhysRevLett.101.107602

Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films

H. W. Jang, S. H. Baek, D. Ortiz, C. M. Folkman, R. R. Das, Y. H. Chu, P. Shafer, J. X. Zhang, S. Choudhury, V. Vaithyanathan, Y. B. Chen, D. A. Felker, M. D. Biegalski, M. S. Rzchowski, X. Q. Pan, D. G. Schlom, L. Q. Chen, R. Ramesh, C. B. Eom

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Abstract

Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant.

Original language	English (US)
Article number	107602
Journal	Physical review letters
Volume	101
Issue number	10
DOIs	https://doi.org/10.1103/PhysRevLett.101.107602
State	Published - Sep 4 2008

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1103/PhysRevLett.101.107602

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Jang, H. W., Baek, S. H., Ortiz, D., Folkman, C. M., Das, R. R., Chu, Y. H., Shafer, P., Zhang, J. X., Choudhury, S., Vaithyanathan, V., Chen, Y. B., Felker, D. A., Biegalski, M. D., Rzchowski, M. S., Pan, X. Q., Schlom, D. G., Chen, L. Q., Ramesh, R., & Eom, C. B. (2008). Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films. Physical review letters, 101(10), Article 107602. https://doi.org/10.1103/PhysRevLett.101.107602

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title = "Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films",

abstract = "Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant.",

author = "Jang, {H. W.} and Baek, {S. H.} and D. Ortiz and Folkman, {C. M.} and Das, {R. R.} and Chu, {Y. H.} and P. Shafer and Zhang, {J. X.} and S. Choudhury and V. Vaithyanathan and Chen, {Y. B.} and Felker, {D. A.} and Biegalski, {M. D.} and Rzchowski, {M. S.} and Pan, {X. Q.} and Schlom, {D. G.} and Chen, {L. Q.} and R. Ramesh and Eom, {C. B.}",

year = "2008",

month = sep,

day = "4",

doi = "10.1103/PhysRevLett.101.107602",

language = "English (US)",

volume = "101",

journal = "Physical review letters",

issn = "0031-9007",

publisher = "American Physical Society",

number = "10",

}

Jang, HW, Baek, SH, Ortiz, D, Folkman, CM, Das, RR, Chu, YH, Shafer, P, Zhang, JX, Choudhury, S, Vaithyanathan, V, Chen, YB, Felker, DA, Biegalski, MD, Rzchowski, MS, Pan, XQ, Schlom, DG, Chen, LQ, Ramesh, R & Eom, CB 2008, 'Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films', Physical review letters, vol. 101, no. 10, 107602. https://doi.org/10.1103/PhysRevLett.101.107602

TY - JOUR

T1 - Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films

AU - Jang, H. W.

AU - Baek, S. H.

AU - Ortiz, D.

AU - Folkman, C. M.

AU - Das, R. R.

AU - Chu, Y. H.

AU - Shafer, P.

AU - Zhang, J. X.

AU - Choudhury, S.

AU - Vaithyanathan, V.

AU - Chen, Y. B.

AU - Felker, D. A.

AU - Biegalski, M. D.

AU - Rzchowski, M. S.

AU - Pan, X. Q.

AU - Schlom, D. G.

AU - Chen, L. Q.

AU - Ramesh, R.

AU - Eom, C. B.

PY - 2008/9/4

Y1 - 2008/9/4

N2 - Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant.

AB - Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant.

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U2 - 10.1103/PhysRevLett.101.107602

DO - 10.1103/PhysRevLett.101.107602

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VL - 101

JO - Physical review letters

JF - Physical review letters

IS - 10

M1 - 107602

ER -

Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films

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